diff options
| author | Sylwester Nawrocki <s.nawrocki@samsung.com> | 2013-03-14 07:01:24 -0300 |
|---|---|---|
| committer | Mauro Carvalho Chehab <mchehab@redhat.com> | 2013-03-31 10:55:19 -0300 |
| commit | fc39f46b54b600f053bf9bab757023344e97925e (patch) | |
| tree | 43c702bd3b9f5d6765a0f67c5f03ec3ae2d57a41 /Documentation/DocBook/media/v4l/controls.xml | |
| parent | 4163851f7b997e24602cad8e0eae96d31a252548 (diff) | |
[media] V4L: Add MATRIX option to V4L2_CID_EXPOSURE_METERING control
This patch adds a menu option to the V4L2_CID_EXPOSURE_METERING
control for multi-zone metering.
Signed-off-by: Sylwester Nawrocki <s.nawrocki@samsung.com>
Signed-off-by: Kyungmin Park <kyungmin.park@samsung.com>
Signed-off-by: Mauro Carvalho Chehab <mchehab@redhat.com>
Diffstat (limited to 'Documentation/DocBook/media/v4l/controls.xml')
| -rw-r--r-- | Documentation/DocBook/media/v4l/controls.xml | 7 |
1 files changed, 7 insertions, 0 deletions
diff --git a/Documentation/DocBook/media/v4l/controls.xml b/Documentation/DocBook/media/v4l/controls.xml index c8eb6c222274..8d7a77928d49 100644 --- a/Documentation/DocBook/media/v4l/controls.xml +++ b/Documentation/DocBook/media/v4l/controls.xml @@ -3142,6 +3142,13 @@ giving priority to the center of the metered area.</entry> <entry><constant>V4L2_EXPOSURE_METERING_SPOT</constant> </entry> <entry>Measure only very small area at the center of the frame.</entry> </row> + <row> + <entry><constant>V4L2_EXPOSURE_METERING_MATRIX</constant> </entry> + <entry>A multi-zone metering. The light intensity is measured +in several points of the frame and the the results are combined. The +algorithm of the zones selection and their significance in calculating the +final value is device dependant.</entry> + </row> </tbody> </entrytbl> </row> |