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authorTushar Vyavahare <tushar.vyavahare@intel.com>2024-07-02 05:59:16 +0000
committerDaniel Borkmann <daniel@iogearbox.net>2024-07-02 15:12:30 +0200
commite4a195e2b95e4602c667ed19a20f71218df138c2 (patch)
treebc7c68f0934abe113ae48bf973f0bd2618601861 /tools/testing/selftests/bpf/progs/tracing_struct.c
parentd80d61ab0609f7f7168d59ec82ee5f055a4b6be7 (diff)
selftests/xsk: Enhance batch size support with dynamic configurations
Introduce dynamic adjustment capabilities for fill_size and comp_size parameters to support larger batch sizes beyond the previous 2K limit. Update HW_SW_MAX_RING_SIZE test cases to evaluate AF_XDP's robustness by pushing hardware and software ring sizes to their limits. This test ensures AF_XDP's reliability amidst potential producer/consumer throttling due to maximum ring utilization. Signed-off-by: Tushar Vyavahare <tushar.vyavahare@intel.com> Signed-off-by: Daniel Borkmann <daniel@iogearbox.net> Reviewed-by: Maciej Fijalkowski <maciej.fijalkowski@intel.com> Link: https://lore.kernel.org/bpf/20240702055916.48071-3-tushar.vyavahare@intel.com
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