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/* SPDX-License-Identifier: GPL-2.0 */
#ifndef _KUNIT_OF_H
#define _KUNIT_OF_H
#include <kunit/test.h>
struct device_node;
#ifdef CONFIG_OF
void of_node_put_kunit(struct kunit *test, struct device_node *node);
#else
static inline
void of_node_put_kunit(struct kunit *test, struct device_node *node)
{
kunit_skip(test, "requires CONFIG_OF");
}
#endif /* !CONFIG_OF */
#if defined(CONFIG_OF) && defined(CONFIG_OF_OVERLAY) && defined(CONFIG_OF_EARLY_FLATTREE)
int of_overlay_fdt_apply_kunit(struct kunit *test, void *overlay_fdt,
u32 overlay_fdt_size, int *ovcs_id);
#else
static inline int
of_overlay_fdt_apply_kunit(struct kunit *test, void *overlay_fdt,
u32 overlay_fdt_size, int *ovcs_id)
{
kunit_skip(test, "requires CONFIG_OF and CONFIG_OF_OVERLAY and CONFIG_OF_EARLY_FLATTREE for root node");
return -EINVAL;
}
#endif
/**
* __of_overlay_apply_kunit() - Test managed of_overlay_fdt_apply() variant
* @test: test context
* @overlay_begin: start address of overlay to apply
* @overlay_end: end address of overlay to apply
*
* This is mostly internal API. See of_overlay_apply_kunit() for the wrapper
* that makes this easier to use.
*
* Similar to of_overlay_fdt_apply(), except the overlay is managed by the test
* case and is automatically removed with of_overlay_remove() after the test
* case concludes.
*
* Return: 0 on success, negative errno on failure
*/
static inline int __of_overlay_apply_kunit(struct kunit *test,
u8 *overlay_begin,
const u8 *overlay_end)
{
int unused;
return of_overlay_fdt_apply_kunit(test, overlay_begin,
overlay_end - overlay_begin,
&unused);
}
#define of_overlay_begin(overlay_name) __dtbo_##overlay_name##_begin
#define of_overlay_end(overlay_name) __dtbo_##overlay_name##_end
#define OF_OVERLAY_DECLARE(overlay_name) \
extern uint8_t of_overlay_begin(overlay_name)[]; \
extern uint8_t of_overlay_end(overlay_name)[] \
/**
* of_overlay_apply_kunit() - Test managed of_overlay_fdt_apply() for built-in overlays
* @test: test context
* @overlay_name: name of overlay to apply
*
* This macro is used to apply a device tree overlay built with the
* cmd_dt_S_dtbo rule in scripts/Makefile.lib that has been compiled into the
* kernel image or KUnit test module. The overlay is automatically removed when
* the test is finished.
*
* Unit tests that need device tree nodes should compile an overlay file with
* @overlay_name\.dtbo.o in their Makefile along with their unit test and then
* load the overlay during their test. The @overlay_name matches the filename
* of the overlay without the dtbo filename extension. If CONFIG_OF_OVERLAY is
* not enabled, the @test will be skipped.
*
* In the Makefile
*
* .. code-block:: none
*
* obj-$(CONFIG_OF_OVERLAY_KUNIT_TEST) += overlay_test.o kunit_overlay_test.dtbo.o
*
* In the test
*
* .. code-block:: c
*
* static void of_overlay_kunit_of_overlay_apply(struct kunit *test)
* {
* struct device_node *np;
*
* KUNIT_ASSERT_EQ(test, 0,
* of_overlay_apply_kunit(test, kunit_overlay_test));
*
* np = of_find_node_by_name(NULL, "test-kunit");
* KUNIT_EXPECT_NOT_ERR_OR_NULL(test, np);
* of_node_put(np);
* }
*
* Return: 0 on success, negative errno on failure.
*/
#define of_overlay_apply_kunit(test, overlay_name) \
({ \
OF_OVERLAY_DECLARE(overlay_name); \
\
__of_overlay_apply_kunit((test), \
of_overlay_begin(overlay_name), \
of_overlay_end(overlay_name)); \
})
#endif
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